X-ray florescence spectrometry is used to identify and quantify the chemical elements present in solid, powdered and liquid samples. XRF is capable of measuring elements from fluorine to uranium, and in concentrations from ppm level up to 100 wt%.
The XRF facility houses a wavelength dispersive X-ray fluorescence spectrometer PANalytical AxiosmAX fitted with a 4,0 KW Rh X-ray tube. It is set up to analyse a wide range of major and trace elements in geological and environmental materials.
Routine analyses of major elements (SiO2, TiO2, Al2O3, Fe2O3, MnO, MgO, CaO, Na2O, K2O, P2O5, Cr2O3, NiO) are performed on fused-disks prepared from 1.2 g of calcined sample powder mixed with Lithium-Tetraborat. Calibrations based on certified international standards are available for high-SiO2 and low-SiO2 rocks, carbonate rocks, phosphate rocks, as well as Mn- and Fe-rich materials.
Routine trace elements analyses (Sc, V, Cr, Mn, Co, Ni, Cu, Zn, Ga, Ge, As, Se, Br, Rb, Sr, Y, Zr, Nb, Mo, Ag, Cd, Sn, Sb, Te, I, Cs, Ba, La, Ce, Nd, Sm, Yb, Hf, Ta, W, Hg, Tl, Pb, Bi, Th, U) are conducted on disks obtained by pressing 12 g of sample powder on a support of Hoechst-wax-C. The limits of detection depend on the element concerned and the matrix but are typically in the range 1 to 7 ppm.