X-ray fluorescence

Room: 1241
Contact person: Dr. Olivier Reubi (+41 21 692 43 22)
Head: Prof. Othmar Müntener

X-ray florescence spectrometry is a destructive method used to identify and quantify the chemical elements present in solid, powdered and liquid samples. XRF is capable of measuring elements from fluorine to uranium, and in concentrations > 1 ppm.

PANalytical Axios^mAX 

Wavelength dispersive X-ray fluorescence spectrometer fitted with a 4,0 KW Rh X-ray tube. It is set up to analyse a wide range of major and trace elements in geological and environmental materials.
 

Routine analyses of major elements (SiO₂, TiO₂, Al₂O₃, Fe₂O₃, MnO, MgO, CaO, Na₂O, K₂O, P₂O₅, Cr₂O₃, NiO) are performed on fused-disks prepared from 1.2 g of calcined sample powder mixed with Lithium-Tetraborat. Calibrations based on certified international standards are available for high-SiO₂ and low-SiO₂ rocks, carbonate rocks, phosphate rocks, as well as Mn- and Fe-rich materials.

Routine trace elements analyses (Sc, V, Cr, Mn, Co, Ni, Cu, Zn, Ga, Ge, As, Se, Br, Rb, Sr, Y, Zr, Nb, Mo, Ag, Cd, Sn, Sb, Te, I, Cs, Ba, La, Ce, Nd, Sm, Yb, Hf, Ta, W, Hg, Tl, Pb, Bi, Th, U) are conducted on disks obtained by pressing 12 g of sample powder on a support of Hoechst-wax-C. The limits of detection depend on the element concerned and the matrix but are typically in the range 1 to 7 ppm.

Schedule:. Bookings: Olivier Reubi (+41 21 692 43 22)